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Excitation of the metastable chaos in microwave receivers, subjected to ultrashort pulse microwave interference

V.N. Bolotov, S. Denisov, I.I. Magda, V.E. Novikov, Yu. V. Tkach
Electromagnetic Phenomena 1, 30 (1998)



The paper presents results of a series of experimental and theoretical studies, performed on the interactions of electronic equipment (EE) and its component base with USPW electromagnetic radiation with the duration range 10-10 - 10-7. Also presented is a concept of adaptive device testing (ADT) which is designed to adequately describe the complex object response to external electromagnetic interference (EEI). Consideration is given to USPW source field coupling of a relatively narrow- and an ultra-wide band (UWB) radiation frequencies with sophisticated electronic devices. The response of common receiver-amplifier sections (RAS) in the UHF frequency range is exemplified to demonstrate a high functionally destructive USPW action, even at relatively low emission power levels. Finally, the paper investigates a possibility of RAS induced-malfunctioning owing to randomization of its internal state under the action of incident short-pulse microwave radiation, electromagnetic impulses (EMI) and combinations thereof.

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last modified on Monday, 14-Feb-2022 14:09:58 UTC by Sergey Denisov